"SingleCrystal" that supports defect analysis for semiconductors.
Generate dynamic diffraction patterns in collaboration with CrystalMaker.
In the semiconductor industry, accurately identifying defects in crystal structures is essential to ensure product quality and reliability. Defects can lead to decreased device performance and failures, resulting in lower yields. SingleCrystal supports defect analysis by simulating diffraction patterns from single crystals and enabling comparisons with observed patterns. Through collaboration with CrystalMaker, it also enables the generation of dynamic diffraction patterns based on structural data. 【Use Cases】 * Defect analysis using X-rays, neutrons, and TEM * Simulation of diffraction patterns and comparison with experimental results * Visualization and understanding of crystal structures 【Benefits of Implementation】 * Accelerated identification of defects and investigation of causes * Improved product quality and yield enhancement * Increased efficiency in research and development
- Company：ヒューリンクス
- Price：Other
